
Ultrahigh Accurate 3-D
Profilometer
Japanese / English
『3D form measurement case』
『3D form measurement case』
Here is actual measurement result by using UA3P.
Here is actual measurement result by using UA3P.
Wafer level lens measurement
Wafer level lens measurement
Wafer level lenses can be continuously measured to evaluate their shape.
Wafer level lenses can be continuously measured to evaluate their shape.
Applicable model
UA3P-500H/650H/700H
Corresponding option
Wafer chuck and camera unit
Assist Function for Wafer Lens Measurement
Applicable model
UA3P-500H/650H/700H
Corresponding option
Wafer chuck and camera unit
Assist Function for Wafer Lens Measurement

