UA3P

Ultrahigh Accurate 3-D Profilometer

Japanese / English


UA3P

Ultrahigh Accurate 3-D

 Profilometer

Japanese / English

『3D form measurement case』

『3D form measurement case』

Here is actual measurement result by using UA3P.

Here is actual measurement result by using UA3P.



Wafer level lens measurement

Wafer level lens measurement

Wafer level lenses can be continuously measured to evaluate their shape.

Wafer level lenses can be continuously measured to evaluate their shape.

Applicable model
UA3P-500H/650H/700H

Corresponding option
Wafer chuck and camera unit
Assist Function for Wafer Lens Measurement

Applicable model
UA3P-500H/650H/700H

Corresponding option
Wafer chuck and camera unit
Assist Function for Wafer Lens Measurement